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DRAM Test Solution
DRAM Module Tester
FPA’s DRAM inspection technology based on Intel smart built-in self-test (BIST) ensures real clock, fast inspection time, no system drop, PPR, etc. It also enables DRAM module and component inspection/analysis, and can thus be used very effectively for the inspection and analysis of finished products.
01
DRAM ATE(64~128pare)
FPA has DRAM testing and handling technologies based on Intel smart BIST and provides ATE equipment to suit the customer's requirements.
02
DC Tester
Testing of the DRAM module and component (by using a jig) can be performed in one tester for maximum efficiency in the production line.
03
DRAM Module Tester
Equipment to perform a full memory test on DRAM modules to analyze error logs and identify defects
- Real Clock TEST
- FULL MEMORY TEST
- Error log and analysis
- Post Package Repair (PPR)
- 30 test patterns
DRAM ATE(64~128pare)
Automatic semiconductor test equipment to identify defects and assess the conformity of DRAM components
- CPGC-based tester
- DC test
- Post Package Repair (PPR)
- Applicable to MES
- Prompt troubleshooting through modularization of functional elements
DC Tester
Equipment to identify defects through DC test on DRAM memory modules
- Pattern editing
- Automated response through communication
